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MIL-STD-750F, DEPARTMENT OF DEFENSE TEST METHOD STANDARD: TEST METHODS FOR SEMICONDUCTOR DEVICES (03-JAN-2012

MIL-STD-750F, DEPARTMENT OF DEFENSE TEST METHOD STANDARD: TEST METHODS FOR SEMICONDUCTOR DEVICES (03-JAN-2012)., This standard establishes uniform methods for testing semiconductor devices, including basic environmental tests to determine resistance to deleterious effects of natural elements and conditions surrounding military operations, and physical and electrical tests. For the purpose of this standard, the term "devices" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts. This standard is intended to apply only to semiconductor devices.

MIL-STD-750 Rev. F

    

Version:
F01-2012162.44 KB MIL-STD-750F
E11-20069.39 MB MIL-STD-750E
D11-2002856.27 KB MIL-STD-750D_NOTICE-5
D04-2001970.21 KB MIL-STD-750D_NOTICE-4
D02-2000580.06 KB MIL-STD-750D_NOTICE-3
D02-1996862.17 KB MIL-STD-750D_NOTICE-2
D05-1995532.28 KB MIL-STD-750D_NOTICE-1
D02-19955.82 MB MIL-STD-750D
C11-19931.55 MB MIL-STD-750C_NOTICE-8
C06-19931.34 MB MIL-STD-750C_NOTICE-7

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