FSC: 5961 - Semiconductor Devices and Associated Hardware

MIL-D-87157 - MIL-D-87157 (NOTICE 2), MILITARY SPECIFICATION: DISPLAYS, DIODE, LIGHT EMITTING, SOLID STATE, GENERAL SPECIFICATION FOR (17-APR-2003) [S/S BY MIL-PRF-19500/708]

MIL-HDBK-5961 A - MIL-HDBK-5961 (NOTICE 1), MILITARY HANDBOOK: LIST OF STANDARD SEMICONDUCTOR DEVICES (06 DEC 2005) [NO S/S DOCUMENT]

MIL-PRF-19500 K - MIL-PRF-19500K, PERFORMANCE SPECIFICATION: SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR (11 MAR 1996) [SUPERSEDING MIL-S-19500J]

MIL-PRF-19500 M - MIL-PRF-19500M, PERFORMANCE SPECIFICATION: SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR (22 OCT 1999)

MIL-PRF-19500 P - MIL-PRF-19500P, PERFORMANCE SPECIFICATION: SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR (20-OCT-2010)

MIL-PRF-19500 P - MIL-PRF-19500P (W/ AMENDMENT-2), PERFORMANCE SPECIFICATION: SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR (10-APR-2014)

MIL-PRF-19500 P - MIL-PRF-19500P (W/ AMENDMENT-3), PERFORMANCE SPECIFICATION: SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR (06-APRIL-2015)

MIL-STD-750/5 - MIL-STD-750/5, DEPARTMENT OF DEFENSE TEST METHOD STANDARD: HIGH RELIABILITY SPACE APPLICATION TEST METHODS FOR SEMICONDUCTOR DEVICES PART 5: TEST METHODS 5000 THROUGH 5999 (03-JAN-2012)

MIL-STD-750/2 - MIL-STD-750/2, DEPARTMENT OF DEFENSE TEST METHOD STANDARD: MECHANICAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 2: TEST METHODS 2001 THROUGH 2999 (03-JAN-2012)

MIL-STD-750/4 - MIL-STD-750/4, DEPARTMENT OF DEFENSE TEST METHOD STANDARD: DIODE ELECTRICAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 4: TEST METHODS 4000 THROUGH 4999 (03-JAN-2012)

MIL-STD-750/1 A - MIL-STD-750/1A, DEPARTMENT OF DEFENSE TEST METHOD STANDARD: ENVIRONMENTAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 1: TEST METHODS 1000 THROUGH 1999 (11-DEC-2015)

MIL-STD-750/1 A_CHG-1 - MIL-STD-750/1A (W/ CHANGE-1), DEPARTMENT OF DEFENSE TEST METHOD STANDARD: ENVIRONMENTAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 1: TEST METHODS 1000 THROUGH 1999 (13-MAY-2016)

MIL-STD-750/2 A_CHG-3 - MIL-STD-750/2 (W/ CHANGE-3), DEPARTMENT OF DEFENSE TEST METHOD STANDARD: MECHANICAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 2: TEST METHODS 2001 THROUGH 2999 (07-FEB-2018)

MIL-STD-750 C - MIL-STD-750C (NOTICE 7), MILITARY STANDARD: TEST METHODS FOR SEMICONDUCTOR DEVICES (30 JUN 1993)

MIL-STD-750/1 CHG-1 - MIL-STD-750/1 (W/ CHANGE-1), DEPARTMENT OF DEFENSE TEST METHOD STANDARD: ENVIRONMENTAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 1: TEST METHODS 1000 THROUGH 1999 (11-MAR-2013)

MIL-STD-750/5 CHG-1 - MIL-STD-750/5 (W/ CHANGE-1), DEPARTMENT OF DEFENSE TEST METHOD STANDARD: HIGH RELIABILITY SPACE APPLICATION TEST METHODS FOR SEMICONDUCTOR DEVICES PART 5: TEST METHODS 5000 THROUGH 5999 (10-AUG-2018)

MIL-STD-750/1 CHG-2 - MIL-STD-750/1 (W/ CHANGE-2), DEPARTMENT OF DEFENSE TEST METHOD STANDARD: ENVIRONMENTAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 1: TEST METHODS 1000 THROUGH 1999 (01-JUL-2013)

MIL-STD-750/2 CHG-3 - MIL-STD-750/2 (W/ CHANGE-3), DEPARTMENT OF DEFENSE TEST METHOD STANDARD: MECHANICAL TEST METHODS FOR SEMICONDUCTOR DEVICES - TEST METHODS 2001 THROUGH 2999 (29-APR-2013)

MIL-STD-750/4 CHG-3 - MIL-STD-750/4 (w/ CHANGE-3), DEPARTMENT OF DEFENSE TEST METHOD STANDARD: DIODE ELECTRICAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 4: TEST METHODS 4000 THROUGH 4999 (20-DEC-2019)

MIL-STD-750/1 CHG-4 - MIL-STD-750/1 (W/ CHANGE-4), DEPARTMENT OF DEFENSE TEST METHOD STANDARD: ENVIRONMENTAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 1: TEST METHODS 1000 THROUGH 1999 (22-AUG-2014)

MIL-STD-750/1 CHG-5 - MIL-STD-750/1 (W/ CHANGE-5), DEPARTMENT OF DEFENSE TEST METHOD STANDARD: ENVIRONMENTAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 1: TEST METHODS 1000 THROUGH 1999 (24-APR-2015)

MIL-STD-750 D - MIL-STD-750D (NOTICE 1), MILITARY STANDARD: TEST METHODS FOR SEMICONDUCTOR DEVICES (18 MAY 1995)

MIL-STD-750 D - MIL-STD-750D, DEPARTMENT OF DEFENSE TEST METHOD STANDARD: SEMICONDUCTOR DEVICES (28 FEB 1995)

MIL-STD-750 D - MIL-STD-750D (NOTICE 5), DEPARTMENT OF DEFENSE: TEST METHOD STANDARD FOR SEMICONDUCTOR DEVICES (12 NOV 2002

MIL-STD-750 F - MIL-STD-750F, DEPARTMENT OF DEFENSE TEST METHOD STANDARD: TEST METHODS FOR SEMICONDUCTOR DEVICES (03-JAN-2012

MIL-STD-839 - MIL-STD-839 (NOTICE-1), MILITARY STANDARD: PARTS WITH ESTABLISHED RELIABILITY LEVELS, SELECTION AND USE OF (09-JUL-1969) [NO S/S DOCUMENT]

MSFC-STD-3012 A - MSFC-STD-3012A, MSFC TECHNICAL STANDARD: ELECTRICAL, ELECTRONIC, AND ELECTROMECHANICAL (EEE) PARTS MANAGEMENT AND CONTROL REQUIREMENTS FOR MSFC SPACE FLIGHT HARDWARE (14-FEB-2012)