MIL-STD-883F, DEPARTMENT OF DEFENSE TEST METHOD STANDARD: MICROCIRCUITS, TEST STANDARDS (18 JUN 2004) [S/S BY MIL-STD-883G]

MIL-STD-883F, DEPARTMENT OF DEFENSE TEST METHOD STANDARD: MICROCIRCUITS, TEST STANDARDS (18 JUN 2004) [S/S BY MIL-STD-883G]., This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic environmental tests to determine resistance to deleterious effects of natural elements and conditions surrounding military and space operations, mechanical and electrical tests workmanship and training procedures and such other controls and constraints as have been deemed necessary to ensure a uniform level of quality and reliability suitable to the intended applications of those devices.